• ISSN: 2010-0248 (Print)
    • Abbreviated Title: Int. J. Innov.  Manag. Technol.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIMT
    • Editor-in-Chief: Prof. Jin Wang
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HOME > Archive > 2013 > Volume 4 Number 1 (Feb. 2013) >
IJIMT 2013 Vol.4(1): 6-10 ISSN: 2010-0248

Evaluating the Effectiveness of Metamorphic Testing on Edge Detection Programs

K. Y. Sim, D. M. L. Wong, and T. Y. Hii

Abstract—Programmer’s errors in implementing edge detection algorithms could induce faults in edge detection programs. We study Sobel edge detection programs in C and evaluate the effectiveness of Metamorphic Testing technique in detecting faulty edge detection programs. We found that the fault detection effectiveness varies for different metamorphic relations used for testing. Contrary to common believe that faults in image processing programs can be detected with any non-trivial image as test input, our experiment results show that there exists subtle fault that can only be detected when images with certain properties are used as test inputs. Based on these results, we propose general guides for using metamorphic testing to detect faults in edge detection programs.

Index Terms—Component, edge detection, metamorphic testing, software testing.

K. Y. Sim is with the School of Engineering, Computing and Science,Swinburne University of Technology (Sarawak Campus), Sarawak,Malaysia (e-mail: ksim@swinburne.edu.my).
M. L. D. Wong is with the Department of Electrical and Electronic Engineering, Xi’an Jiaotong-Liverpool University, Suzhou, Jiangsu, P.R.China (e-mail: Dennis.Wong@xjtlu.edu.cn).
T. Y. Hii is with the Faculty of Engineering, Multimedia University,Cyberjaya, Malaysia (e-mail: tun_tun88@hotmail.com).

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Cite: K. Y. Sim, D. M. L. Wong, and T. Y. Hii, "Evaluating the Effectiveness of Metamorphic Testing on Edge Detection Programs," International Journal of Innovation, Management and Technology vol. 4, no. 1, pp. 6-10, 2013.

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